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Deposition and Characterization of Zinc Oxide Films

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dc.creator KARAKAYA, Seniye
dc.creator ÖZBAŞ, Ömer
dc.date 2014-07-11T21:55:29Z
dc.date.accessioned 2019-07-09T11:59:58Z
dc.date.available 2019-07-09T11:59:58Z
dc.identifier http://dergipark.org.tr/sdufenbed/issue/20802/222034
dc.identifier 10.19113/sdufbed.78453
dc.identifier.uri http://acikerisim.sdu.edu.tr/xmlui/handle/123456789/46526
dc.description Zinc oxide (ZnO) is suitable for optoelectronic applications due to its electrical and optical properties. The present work deals with the preparation and characterization of ZnO films deposited by the ultrasonic spray pyrolysis method. The starting solution was zinc acetate. Effects of substrate temperature on films properties have been investigated. Optical properties of the films have been characterized by investigating transmittance, absorbance and photoluminescence (PL) spectra. Optical transmission spectrum shows that ZnO films have high transmission (about 80%) in visible region for substrate temperatures at 350oC. Surface morphology of the films has also been analyzed by atomic force microscope (AFM). Four probes conductivity measurements have been used for electrical characterization. The resistivity of ZnO films increases with increasing substrate temperatures
dc.description Zinc oxide (ZnO) is suitable for optoelectronic applications due to its electrical and optical properties. The present work deals with the preparation and characterization of ZnO films deposited by the ultrasonic spray pyrolysis method. The starting solution was zinc acetate. Effects of substrate temperature on films properties have been investigated. Optical properties of the films have been characterized by investigating transmittance, absorbance and photoluminescence (PL) spectra. Optical transmission spectrum shows that ZnO films have high transmission (about 80%) in visible region for substrate temperatures at 350oC. Surface morphology of the films has also been analyzed by atomic force microscope (AFM). Four probes conductivity measurements have been used for electrical characterization. The resistivity of ZnO films increases with increasing substrate temperatures.
dc.format application/pdf
dc.language en
dc.publisher Süleyman Demirel University
dc.publisher Süleyman Demirel Üniversitesi
dc.relation http://dergipark.org.tr/download/article-file/193845
dc.source Volume: 17, Issue: 3 49-51 en-US
dc.source 1308-6529
dc.subject ZnO; AFM; Photolüminescence
dc.subject ZnO AKM Fotolüminesans Spektrum(PL)
dc.title Deposition and Characterization of Zinc Oxide Films en-US
dc.type info:eu-repo/semantics/article


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