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Enhancement Physical Performance of Nanostructured CuO Films via Surfactant TX-100

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dc.creator AYDIN, Raşit
dc.creator ŞAHİN, Bünyamin
dc.date 2018-08-15T00:00:00Z
dc.date.accessioned 2019-07-09T12:00:31Z
dc.date.available 2019-07-09T12:00:31Z
dc.identifier http://dergipark.org.tr/sdufenbed/issue/38975/456345
dc.identifier
dc.identifier.uri http://acikerisim.sdu.edu.tr/xmlui/handle/123456789/46775
dc.description In this study, we informed a systematic approach to obtain CuO films with and without TX-100 surfactant by the SILAR procedure. Morphological, structural and optical features of the CuO films were researched by metallurgical microscope, scanning electron microscopy, X-ray diffraction analysis and ultraviolet–visible spectrophotometry respectively with respect to concentrations of TX-100 agent. Metallurgical and scanning electron microscope photographs displayed that the morphology of the film surface was impressed by surfactant TX-100. X-ray diffraction patterns verified that all CuO films have monoclinic crystal lattice structure with preferential orientations of ( 11) and (111) planes. Ultraviolet–visible spectra demonstrated that the optical bandgap and transmittance values of the films were altered with TX-100 content.
dc.format application/pdf
dc.publisher Süleyman Demirel University
dc.publisher Süleyman Demirel Üniversitesi
dc.relation http://dergipark.org.tr/download/article-file/528948
dc.source Volume: 22, Issue: 2 545-551 en-US
dc.source 1308-6529
dc.subject Copper Oxide (CuO),Triton X-100; XRD; Band Gap
dc.title Enhancement Physical Performance of Nanostructured CuO Films via Surfactant TX-100 en-US
dc.type info:eu-repo/semantics/article


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