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Effect of indentation on I-V characteristics of Au/n-GaAs Schottky barrier diodes

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dc.creator Calik, ADNAN
dc.creator Cankaya, Guven
dc.creator ÖZDEMİR, Ahmet Faruk
dc.creator UÇAR, Nazım
dc.creator SAHIN, Osman
dc.date 2008-02-29T22:00:00Z
dc.date.accessioned 2020-10-06T10:51:06Z
dc.date.available 2020-10-06T10:51:06Z
dc.identifier a3757441-5f7f-4a31-b6a5-02edefe7c7a1
dc.identifier 10.1515/zna-2008-3-414
dc.identifier https://avesis.sdu.edu.tr/publication/details/a3757441-5f7f-4a31-b6a5-02edefe7c7a1/oai
dc.identifier.uri http://acikerisim.sdu.edu.tr/xmlui/handle/123456789/68167
dc.description Au/n-GaAs Schottky barrier diodes (SBDs) have been fabricated. The effect of indentation on Schottky diode parameters such as Schottky barrier height (phi(b)) and ideality factor (n) was studied by current-voltage (I-V) measurements. The method used for indentation was the Vickers microhardness test at room temperature. The experimental results showed that the I-V characteristics move to lower currents due to an increase of Ob with increasing indentation weight, while contacts showed a nonideal diode behaviour.
dc.language eng
dc.rights info:eu-repo/semantics/closedAccess
dc.title Effect of indentation on I-V characteristics of Au/n-GaAs Schottky barrier diodes
dc.type info:eu-repo/semantics/article


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