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The Analysis of Capacitance-Voltage and Conductance voltage Characteristics of Zr/p-Si Schottky Diodes with a Native Oxide Interfacial Layer at High Frequencies

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dc.creator UÇAR, NAZIM
dc.creator ALDEMİR, DURMUŞ ALİ
dc.creator ÖZDEMİR, AHMET FARUK
dc.date 2019-09-25T21:00:00Z
dc.date.accessioned 2020-10-06T12:02:41Z
dc.date.available 2020-10-06T12:02:41Z
dc.identifier f71b8fa1-8fe0-432c-b6ea-6ec6b75f64b6
dc.identifier https://avesis.sdu.edu.tr/publication/details/f71b8fa1-8fe0-432c-b6ea-6ec6b75f64b6/oai
dc.identifier.uri http://acikerisim.sdu.edu.tr/xmlui/handle/123456789/76461
dc.description
dc.language eng
dc.rights info:eu-repo/semantics/closedAccess
dc.title The Analysis of Capacitance-Voltage and Conductance voltage Characteristics of Zr/p-Si Schottky Diodes with a Native Oxide Interfacial Layer at High Frequencies
dc.type info:eu-repo/semantics/conferenceObject


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