DSpace Repository

RF-CF4 plasma surface modification of paper: Chemical evaluation of two sidedness with XPS/ATR-FTIR

Show simple item record

dc.creator Sahin, Hahl Turgut
dc.date 2007-02-28T01:00:00Z
dc.date.accessioned 2021-12-03T11:14:59Z
dc.date.available 2021-12-03T11:14:59Z
dc.identifier 0c4318fe-3222-48b1-8800-fe35c5da836a
dc.identifier 10.1016/j.apsusc.2006.09.052
dc.identifier https://avesis.sdu.edu.tr/publication/details/0c4318fe-3222-48b1-8800-fe35c5da836a/oai
dc.identifier.uri http://acikerisim.sdu.edu.tr/xmlui/handle/123456789/89896
dc.description The study was performed to examine the correlation between the initial roughness and surface fluorination of paper under RF-CF4 plasma environment.
dc.language eng
dc.rights info:eu-repo/semantics/closedAccess
dc.title RF-CF4 plasma surface modification of paper: Chemical evaluation of two sidedness with XPS/ATR-FTIR
dc.type info:eu-repo/semantics/article


Files in this item

Files Size Format View

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record

Search DSpace


Advanced Search

Browse

My Account