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A STUDY OF THE ELECTRON OPTICAL PROPERTIES OF HEMISPHERICAL DEFLECTION ANALYZERS AIMED AT OPTIMIZING THEIR FRINGING FIELD CORRECTION SCHEMES

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dc.creator Sise, Omer
dc.date 2015-01-01T01:00:00Z
dc.date.accessioned 2021-12-03T12:05:15Z
dc.date.available 2021-12-03T12:05:15Z
dc.identifier f5e20671-4dc0-4f3a-941d-8140e63ddeb6
dc.identifier https://avesis.sdu.edu.tr/publication/details/f5e20671-4dc0-4f3a-941d-8140e63ddeb6/oai
dc.identifier.uri http://acikerisim.sdu.edu.tr/xmlui/handle/123456789/95867
dc.description First-order focusing characteristic of hemispherical deflection analyzers (HDAs) is limited due to fringing field at the boundaries of the electrodes. In this paper, we present a systematic study of fringing field effects for different ratios of the gap to mean radius in the range of 0.2 <= Delta R/R-m <= 0.6 and compare the performance of some useful designs, i. e., ideal HDA, fringing field HDA, Herzog correction, Jost correction, tilted input beam angle, and biased paracentric configuration for resolution improvement.
dc.language eng
dc.rights info:eu-repo/semantics/closedAccess
dc.title A STUDY OF THE ELECTRON OPTICAL PROPERTIES OF HEMISPHERICAL DEFLECTION ANALYZERS AIMED AT OPTIMIZING THEIR FRINGING FIELD CORRECTION SCHEMES
dc.type info:eu-repo/semantics/article


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